Experimental analysis of variability in WS2-based devices for hardware security

  1. Vatalaro, M.
  2. Neill, H.
  3. Gity, F.
  4. Magnone, P.
  5. Maccaronio, V.
  6. Márquez, C.
  7. Galdon, J.C.
  8. Gamiz, F.
  9. Crupi, F.
  10. Hurley, P.
  11. De Rose, R.
Revista:
Solid-State Electronics

ISSN: 0038-1101

Ano de publicación: 2023

Volume: 207

Tipo: Artigo

DOI: 10.1016/J.SSE.2023.108701 GOOGLE SCHOLAR
Fonte de datos: Scopus