Experimental analysis of variability in WS2-based devices for hardware security

  1. Vatalaro, M.
  2. Neill, H.
  3. Gity, F.
  4. Magnone, P.
  5. Maccaronio, V.
  6. Márquez, C.
  7. Galdon, J.C.
  8. Gamiz, F.
  9. Crupi, F.
  10. Hurley, P.
  11. De Rose, R.
Revue:
Solid-State Electronics

ISSN: 0038-1101

Année de publication: 2023

Volumen: 207

Type: Article

DOI: 10.1016/J.SSE.2023.108701 GOOGLE SCHOLAR
La source de données: Scopus