Experimental analysis of variability in WS2-based devices for hardware security

  1. Vatalaro, M.
  2. Neill, H.
  3. Gity, F.
  4. Magnone, P.
  5. Maccaronio, V.
  6. Márquez, C.
  7. Galdon, J.C.
  8. Gamiz, F.
  9. Crupi, F.
  10. Hurley, P.
  11. De Rose, R.
Journal:
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 2023

Volume: 207

Type: Article

DOI: 10.1016/J.SSE.2023.108701 GOOGLE SCHOLAR
Data source: Scopus