Experimental analysis of variability in WS2-based devices for hardware security
- Vatalaro, M.
- Neill, H.
- Gity, F.
- Magnone, P.
- Maccaronio, V.
- Márquez, C.
- Galdon, J.C.
- Gamiz, F.
- Crupi, F.
- Hurley, P.
- De Rose, R.
Aldizkaria:
Solid-State Electronics
ISSN: 0038-1101
Argitalpen urtea: 2023
Alea: 207
Mota: Artikulua