Publicaciones en las que colabora con JUAN BAUTISTA ROLDÁN ARANDA (8)

2023

  1. An approach to non-homogenous phase-type distributions through multiple cut-points

    Quality Engineering, Vol. 35, Núm. 4, pp. 619-638

2021

  1. A complex model via phase-type distributions to study random telegraph noise in resistive memories

    Mathematics, Vol. 9, Núm. 4, pp. 1-16

  2. Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies

    Solid-State Electronics, Vol. 176

  3. Linear-Phase-Type probability modelling of functional PCA with applications to resistive memories

    Mathematics and Computers in Simulation, Vol. 186, pp. 71-79

  4. One cut‐point phase‐type distributions in reliability. An application to resistive random access memories

    Mathematics, Vol. 9, Núm. 21

2020

  1. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2019

  1. Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs

    Microelectronic Engineering, Vol. 214, pp. 104-109

  2. Phase-type distributions for studying variability in resistive memories

    Journal of Computational and Applied Mathematics, Vol. 345, pp. 23-32