Publications dans lesquelles il/elle collabore avec JUAN ELOY RUIZ CASTRO (9)

2024

  1. Different PCA approaches for vector functional time series with applications to resistive switching processes

    Mathematics and Computers in Simulation, Vol. 223, pp. 288-298

2023

  1. An approach to non-homogenous phase-type distributions through multiple cut-points

    Quality Engineering, Vol. 35, Núm. 4, pp. 619-638

2021

  1. A complex model via phase-type distributions to study random telegraph noise in resistive memories

    Mathematics, Vol. 9, Núm. 4, pp. 1-16

  2. Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies

    Solid-State Electronics, Vol. 176

  3. Linear-Phase-Type probability modelling of functional PCA with applications to resistive memories

    Mathematics and Computers in Simulation, Vol. 186, pp. 71-79

  4. One cut‐point phase‐type distributions in reliability. An application to resistive random access memories

    Mathematics, Vol. 9, Núm. 21

2020

  1. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2019

  1. Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs

    Microelectronic Engineering, Vol. 214, pp. 104-109

  2. Phase-type distributions for studying variability in resistive memories

    Journal of Computational and Applied Mathematics, Vol. 345, pp. 23-32