Publicaciones en las que colabora con CHRISTIAN JOSE ACAL GONZÁLEZ (15)

2023

  1. Basis expansion approaches for functional analysis of variance with repeated measures

    Advances in Data Analysis and Classification, Vol. 17, Núm. 2, pp. 291-321

  2. Holistic Variability Analysis in Resistive Switching Memories Using a Two-Dimensional Variability Coefficient

    ACS Applied Materials and Interfaces, Vol. 15, Núm. 15, pp. 19102-19110

2022

  1. Functional ANOVA approaches for detecting changes in air pollution during the COVID-19 pandemic

    Stochastic Environmental Research and Risk Assessment, Vol. 36, Núm. 4, pp. 1083-1101

  2. logitFD: an R package for functional principal component logit regression

    R Journal, Vol. 14, Núm. 3, pp. 231-248

2021

  1. A complex model via phase-type distributions to study random telegraph noise in resistive memories

    Mathematics, Vol. 9, Núm. 4, pp. 1-16

  2. Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies

    Solid-State Electronics, Vol. 176

  3. COVID-19 data imputation by multiple function-on-function principal component regression

    Mathematics, Vol. 9, Núm. 11

  4. Homogeneity problem for basis expansion of functional data with applications to resistive memories

    Mathematics and Computers in Simulation, Vol. 186, pp. 41-51

  5. Linear-Phase-Type probability modelling of functional PCA with applications to resistive memories

    Mathematics and Computers in Simulation, Vol. 186, pp. 71-79

  6. Phase-Type distributions: computational aspects andapplications in electronics

    BEIO, Boletín de Estadística e Investigación Operativa, Vol. 37, Núm. 1, pp. 3-18

2020

  1. New modeling approaches based on varimax rotation of functional principal components

    Mathematics, Vol. 8, Núm. 11, pp. 1-15

  2. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2019

  1. Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs

    Microelectronic Engineering, Vol. 214, pp. 104-109

  2. Distribuciones tipo fase en un estudio de fiabilidad

    TEMat: Divulgación de trabajos de estudiantes de matemáticas, Núm. 3, pp. 63-74

  3. Phase-type distributions for studying variability in resistive memories

    Journal of Computational and Applied Mathematics, Vol. 345, pp. 23-32