Publicaciones en colaboración con investigadores/as de KU Leuven (9)

2012

  1. Dependence of generation-recombination noise with gate voltage in FD SOI MOSFETs

    IEEE Transactions on Electron Devices, Vol. 59, Núm. 10, pp. 2780-2786

  2. Insights in low frequency noise of advanced and high-mobility channel transistors

    2012 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)

2010

  1. Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions

    2010 Proceedings of the European Solid State Device Research Conference, ESSDERC 2010