JUAN BAUTISTA ROLDÁN ARANDA-rekin lankidetzan egindako argitalpenak (16)

2023

  1. Holistic Variability Analysis in Resistive Switching Memories Using a Two-Dimensional Variability Coefficient

    ACS Applied Materials and Interfaces, Vol. 15, Núm. 15, pp. 19102-19110

2020

  1. Reversible dielectric breakdown in h-BN stacks: A statistical study of the switching voltages

    IEEE International Reliability Physics Symposium Proceedings

2018

  1. Modelling Resistive Random Access Memories by Means of Functional Principal Component Analysis

    Advances in Mass Data Analysis of Images and Signals with Applications in Medicine, r/g/b Biotechnology, Food Industries and Dietetics, Biometry and Security, Agriculture, Drug Discover, and System Biology - 12th International Conference, MDA 2017, Proceedings

  2. Multivariate analysis and extraction of parameters in resistive RAMs using the Quantum Point Contact model

    Journal of Applied Physics, Vol. 123, Núm. 1