JUAN BAUTISTA
ROLDÁN ARANDA
CATEDRÁTICO DE UNIVERSIDAD
FRANCISCO JESÚS
GÁMIZ PÉREZ
CATEDRÁTICO DE UNIVERSIDAD
FRANCISCO JESÚS GÁMIZ PÉREZ-rekin lankidetzan egindako argitalpenak (74)
2013
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An analytical mobility model for square Gate-All-Around MOSFETs
Solid-State Electronics, Vol. 90, pp. 18-22
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An in-depth Monte Carlo study of low-field mobility in ultra-thin body DGMOSFETs for modeling purposes
Solid-State Electronics, Vol. 79, pp. 92-97
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An in-depth simulation study of thermal reset transitions in resistive switching memories
Journal of Applied Physics, Vol. 114, Núm. 14
2012
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Inversion charge modeling in n-type and p-type Double-Gate MOSFETs including quantum effects: The role of crystallographic orientation
Solid-State Electronics, Vol. 67, Núm. 1, pp. 30-37
2011
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An inversion-charge analytical model for square gate-all-around MOSFETs
IEEE Transactions on Electron Devices, Vol. 58, Núm. 9, pp. 2854-2861
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Analytical drain current model reproducing advanced transport models in nanoscale double-gate (DG) MOSFETs
2011 12th International Conference on Ultimate Integration on Silicon, ULIS 2011
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Compact drain-current model for reproducing advanced transport models in nanoscale double-gate MOSFETs
Semiconductor Science and Technology, Vol. 26, Núm. 9
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In-depth study of quantum effects in SOI DGMOSFETs for different crystallographic orientations
IEEE Transactions on Electron Devices, Vol. 58, Núm. 12, pp. 4438-4441
2010
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An analytical I-V model for surrounding-gate transistors that includes quantum and velocity overshoot effects
IEEE Transactions on Electron Devices, Vol. 57, Núm. 11, pp. 2925-2933
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An analytical model for square GAA MOSFETs including quantum effects
Solid-State Electronics, Vol. 54, Núm. 11, pp. 1463-1469
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Hole transport in DGSOI devices: Orientation and silicon thickness effects
Solid-State Electronics, Vol. 54, Núm. 2, pp. 191-195
2009
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A new inversion charge centroid model for surrounding gate transistors with HfO2 as gate insulator
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
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Monte Carlo simulation of nanoelectronic devices
Journal of Computational Electronics, Vol. 8, Núm. 3-4, pp. 174-191
2008
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A in-depth simulation study of CMOS inverters based on the novel surrounding gate transistors
Proceedings - International Conference on Advances in Electronics and Micro-electronics, ENICS 2008
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Modeling the centroid and the inversion charge in cylindrical surrounding gate MOSFETs, including quantum effects
IEEE Transactions on Electron Devices, Vol. 55, Núm. 1, pp. 411-416
2007
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An electron mobility model for ultra-thin gate-oxide MOSFETs including the contribution of remote scattering mechanisms
Semiconductor Science and Technology, Vol. 22, Núm. 4, pp. 348-353
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Modeling of inversion layer centroid and polysilicon depletion effects on ultrathin-gate-oxide mOSFET behavior: The influence of crystallographic orientation
IEEE Transactions on Electron Devices, Vol. 54, Núm. 4, pp. 723-732
2006
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Acoustic phonon confinement in silicon nanolayers: Effect on electron mobility
Journal of Applied Physics, Vol. 100, Núm. 1
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Characterization of electron transport at high fields in silicon-on-insulator devices: A Monte Carlo study
Semiconductor Science and Technology, Vol. 21, Núm. 1, pp. 81-86
2005
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Double gate silicon-on-insulator transistors: N+-n+ gate versus n+-p+ gate configuration
2005 Spanish Conference on Electron Devices, Proceedings