Publicaciones en las que colabora con Abraham Luque Rodríguez (21)

2013

  1. Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs

    ECS Transactions

  2. Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: Challenges and opportunities

    ECS Journal of Solid State Science and Technology, Vol. 2, Núm. 11

2012

  1. DC and low-frequency noise optimization of four-gate transistors

    2012 8th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2012

  2. Dependence of generation-recombination noise with gate voltage in FD SOI MOSFETs

    IEEE Transactions on Electron Devices, Vol. 59, Núm. 10, pp. 2780-2786

  3. Effects of gate oxide and junction nonuniformity on the DC and low-frequency noise performance of four-gate transistors

    IEEE Transactions on Electron Devices, Vol. 59, Núm. 2, pp. 459-467

  4. Insights in low frequency noise of advanced and high-mobility channel transistors

    Technical Digest - International Electron Devices Meeting, IEDM

  5. On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs

    European Solid-State Device Research Conference

2011

  1. Ge content and recess depth dependence of the band-to-band tunneling current in Si1-xGex/Si hetero-junctions

    Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011

  2. Impact of Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions

    IEEE Transactions on Electron Devices, Vol. 58, Núm. 8, pp. 2362-2370

  3. Learning in a virtual laboratory: Educational applications of three-dimensional animations

    International Journal of Innovation and Learning, Vol. 9, Núm. 3, pp. 325-337

  4. Miniband structure and photon absorption in regimented quantum dot systems

    Journal of Applied Physics

  5. Optoelectronic properties in InAs/GaAs quantum dots arrays systems

    Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011

  6. Study of 1/f and generation-recombination noise in four gate transistors

    Proceedings of the IEEE 21st International Conference on Noise and Fluctuations, ICNF 2011

2010

  1. Localization and quantification of noise sources in four-gate field-effect-transistors

    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

  2. Modeling impact of electric field and strain on the leakage of embedded SiGe source/drain junctions

    2010 Proceedings of the European Solid State Device Research Conference, ESSDERC 2010

2009

  1. 3D animations used for teaching

    20th EAEEIE Annual Conference, EAEEIE 2009 - Formal Proceedings

  2. Effect of traps in the performance of four gate transistors

    Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

  3. Improvement of the k · p approach for describing silicon quantum dots

    Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

  4. Influence of dopant profiles and traps on the low frequency noise of four gate transistors

    AIP Conference Proceedings

2008

  1. A low-frequency noise model for four-gate field-effect transistors

    IEEE Transactions on Electron Devices, Vol. 55, Núm. 3, pp. 896-903